Test system for semiconductor components having conductive spring contacts

ABSTRACT

An interconnect for testing a semiconductor component includes a substrate, and interconnect contacts on the substrate configured to electrically engage component contacts on a semiconductor component. Each interconnect contact includes a compliant conductive layer formed as a conductive spring element. In addition, the complaint conductive layer includes a tip for engaging the component contact and a spring segment portion for resiliently supporting the tip. A method for fabricating the interconnect includes the steps of shaping the substrate, forming a conductive layer on a shaped portion of the substrate and removing at least some of the shaped portion. The shaped portion can comprise a raised step or dome, or a shaped recess in the substrate. The conductive layer can comprise a metal, a conductive polymer or a polymer tape can include a penetrating structure or penetrating particles. The interconnect can be used to construct wafer level test systems, and die level test systems as well, for semiconductor components such as wafers, dice and packages.

CROSS REFERENCE TO RELATED APPLICATIONS

This application is a division of Ser. No. 11/030,772 filed Jan. 6,2005, U.S. Pat. No. 7,314,821, which is a division of Ser. No.10/619,650 filed Jul. 14, 2003, U.S. Pat. No. 7,042,080.

This application is related to Ser. No. 11/031,160 filed Jan. 6, 2005,to Ser. No. 11/347,930 filed Feb. 6, 2006, and to Ser. No. 11/366,073filed Mar. 2, 2006.

FIELD OF THE INVENTION

This invention relates generally to semiconductor manufacture andtesting. More particularly, this invention relates to an interconnectfor electrically engaging semiconductor components, to a method forfabricating the interconnect and to test systems incorporating theinterconnect.

BACKGROUND OF THE INVENTION

During the fabrication process semiconductor components are tested toevaluate electrical characteristics of the components, and particularlythe integrated circuits contained on the components. For example,semiconductor dice and semiconductor packages on a wafer are probetested on the wafer, and can also be burn-in tested and parametrictested following singulation from the wafer. For performing the tests,an interconnect having interconnect contacts is used to make temporaryelectrical connections with component contacts on the components. Testsignals are then transmitted through the interconnect contacts and thecomponent contacts, to the integrated circuits.

The interconnect contacts preferably have a flexibility or compliancy,which compensates for variations in the size, location and planarity ofthe component contacts. Probe needles and “POGO PINS” are two types ofcompliant interconnect contacts designed to make reliable electricalconnections, even with variations in the component contacts.

As component contacts become denser and more closely spaced, it becomeseven more difficult to make the temporary electrical connections withthe component contacts. It also becomes more difficult to fabricate theinterconnect contacts with the required size and spacing. Further,interconnect contacts tend to wear with continued usage, which alsomakes the temporary electrical connections more difficult to make.

The present invention is directed to an interconnect having compliantinterconnect contacts able to make reliable electrical connections withsmall closely spaced component contacts. In addition, the presentinvention is directed to a fabrication method for the interconnect, andto test systems incorporating the interconnect.

SUMMARY OF THE INVENTION

In accordance with the present invention, improved interconnects forsemiconductor components, methods for fabricating the interconnects andtest systems incorporating the interconnects are provided.

The interconnect includes a substrate and a plurality of interconnectcontacts on the substrate configured to electrically engage componentcontacts on a semiconductor component. Each interconnect contactincludes a compliant conductive layer on the substrate and a conductorin electrical communication with the compliant conductive layer.

The compliant conductive layer can be comprised of a metal, a conductivepolymer or a polymer tape. The complaint conductive layer includes abase portion on the substrate, a tip portion configured to contact acomponent contact, and a spring segment portion configured to supportthe tip portion for axial movement. The tip portion can also include oneor more penetrating structures, such as blades, points, or particles,configured to penetrate the component contact. In addition, the baseportion of the compliant conductive layer can be contained in an openingin the substrate.

A method for fabricating the interconnect includes the steps of shapingthe substrate, forming a compliant conductive layer on a shaped portionof the substrate, and removing at least some of the shaped portion. Theshaped portion of the substrate can comprise a raised step, a domeshape, or a shaped opening in the substrate.

A wafer level test system includes test circuitry, a wafer prober, and awafer sized interconnect mounted to the wafer prober in electricalcommunication with the test circuitry. A die level test system includestest circuitry, a test carrier configured to retain discretesemiconductor components, such as bare dice and packages, and a diesized interconnect mounted to the test carrier in electricalcommunication with the test circuitry.

BRIEF DESCRIPTION OF THE DRAWINGS

All of the drawing Figures, particularly the cross sectional views, areschematic, such that the elements contained therein are not to scale.

FIG. 1A is a schematic plan view of a wafer level interconnectconstructed in accordance with the invention;

FIG. 1B is an enlarged schematic plan view taken along line 1B of FIG.1A illustrating an interconnect contact on the interconnect;

FIG. 1C is an enlarged schematic cross sectional view of theinterconnect contact taken along line 1C-1C of FIG. 1B;

FIG. 1D is a schematic plan view of a semiconductor wafer;

FIG. 1E is an enlarged schematic cross sectional view illustrating theinterconnect contact electrically engaging a component contact;

FIG. 1F is an enlarged schematic cross sectional view illustrating theinterconnect contact flexing during electrical engagement of thecomponent contact;

FIG. 1G is an enlarged schematic cross sectional view illustrating theinterconnect contact electrically engaging a bumped component contact;

FIG. 1H is an enlarged schematic cross sectional view illustrating analternate embodiment interconnect contact with a penetrating structure;

FIG. 1I is an enlarged schematic cross sectional view illustrating analternate embodiment interconnect contact with penetrating particles;

FIG. 2A is an enlarged schematic plan view equivalent to FIG. 1Billustrating an alternate embodiment interconnect contact having a domeshape;

FIG. 2B is an enlarged schematic cross sectional view of the alternateembodiment interconnect contact taken along line 2B-2B of FIG. 2A;

FIG. 2C is an enlarged schematic cross sectional view illustrating thealternate embodiment interconnect contact electrically engaging acomponent contact;

FIG. 3A is an enlarged schematic plan view equivalent to FIG. 1Billustrating an alternate embodiment interconnect contact having anenclosed square shape;

FIG. 3B is an enlarged schematic cross sectional view of the alternateembodiment interconnect contact taken along line 3B-3B of FIG. 3A;

FIG. 3C is an enlarged schematic cross sectional view illustrating thealternate embodiment interconnect contact electrically engaging acomponent contact;

FIG. 4 is an enlarged schematic cross sectional view equivalent to FIG.1C of an alternate embodiment interconnect contact having a polymertape;

FIG. 5A is an enlarged schematic plan view equivalent to FIG. 1Billustrating an alternate embodiment interconnect contact having anopening in the substrate;

FIG. 5B is an enlarged schematic cross sectional view of the alternateembodiment interconnect contact taken along line 5B-5B of FIG. 5A;

FIGS. 5C and 5D are enlarged schematic cross sectional viewsillustrating the alternate embodiment interconnect contact electricallyengaging a component contact;

FIG. 6 is an enlarged schematic cross sectional view equivalent to FIG.1C of an alternate embodiment interconnect contact having an enclosedspring shape;

FIGS. 7A-7H are schematic cross sectional views illustrating steps in amethod for fabricating the interconnect contact of FIGS. 1A-1F;

FIGS. 8A-8G are schematic cross sectional views illustrating steps in amethod for fabricating the interconnect contact of FIGS. 5A-5D and FIG.6;

FIG. 9 is a schematic cross sectional view of a wafer level test systemincorporating the wafer level interconnect of FIG. 1A;

FIG. 10A is an enlarged schematic plan view of a die level interconnectconstructed in accordance with the invention;

FIG. 10B is a schematic plan view of a singulated semiconductorcomponent having bumped component contacts;

FIG. 11A is a schematic perspective view of a die level test systemincorporating the die level interconnect of FIG. 10A;

FIG. 11B is a schematic perspective view of a test carrier of the dielevel test system in a closed, position; and

FIG. 11C is a cross sectional view with parts removed taken alongsection line 11C-11C of FIG. 11B illustrating the die level interconnectof the test system electrically engaging a component.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT

As used herein, the term “semiconductor component” refers to anelectronic component that includes a semiconductor die. Exemplarysemiconductor components include semiconductor wafers, semiconductordice, semiconductor packages, and BGA devices.

Referring to FIGS. 1A-1F, a wafer level interconnect 10 constructed inaccordance with the invention is illustrated. The interconnect 10 isconfigured to test a semiconductor wafer 12 (FIG. 1D) containing aplurality of semiconductor components 14 (FIG. 1D), such as dice orpackages. Each component 14 includes a plurality of component contacts16 such as bond pads, redistribution pads, test pads or terminalcontacts in electrical communication with the integrated circuitscontained on the components 14.

In the illustrative embodiment, the interconnect 10 is configured toelectrically engage all of the component contacts 16 on the components14 on the wafer 12 at the same time. However, the interconnect 10 canalso be configured to electrically engage one component 14 on the wafer12 at a time, or clusters of two or more components 14 on the wafer 12at a time. The interconnect 10 can also be configured to test otherwafer sized components, such as leadframes, strips, or panels containingmultiple semiconductor components. Further, as will be furtherexplained, a die level interconnect 10D (FIG. 11A) can be configured totest singulated components 14, such as dice or packages.

As shown in FIG. 1A, the interconnect 10 includes a substrate 18, and aplurality of patterns 20 of interconnect contacts 22 on the substrate18. In FIG. 1A, each pattern 20 of interconnect contacts 22 is denotedby dotted lines having outlines corresponding to the outlines of thecomponents 14 on the wafer 12. In addition, the interconnect contacts 22are located on a first side 26 (face) of the substrate 18.

The substrate 18 can comprise a semiconductor material, such as silicon,germanium or gallium arsenide. Alternately, the substrate 18 cancomprise another machineable or etchable material, such as ceramic orplastic. With a semiconductor material, the substrate 18 also includeselectrically insulating layers 32, such as polymer or oxide layers,which electrically insulate the bulk of the substrate 18 from theinterconnect contacts 22, and other electrical elements of theinterconnect 10 as well. However, if the substrate 18 comprises anelectrically insulating material, such as plastic or ceramic, theinsulating layers 32 are not required.

The interconnect 10 can also include a plurality of conductors 46 andconductive vias 24 (FIG. 1C) in electrical communication with theinterconnect contacts 22. In addition, the interconnect 10 can include aplurality of terminal contacts 28 on a second side 30 (back side) of thesubstrate 18 in electrical communication with the conductive vias 24. Aswill be further explained, the terminal contacts 28 provide electricalconnection points from test circuitry 34 (FIG. 1F) configured to applytest signals through the interconnect 10 to the components 14.

As shown in FIGS. 1B and 1C, each interconnect contact 22 includes acompliant conductive layer 36 on the substrate 18 in electricalcommunication with a conductor 46 and a conductive via 24. In addition,the compliant conductive layer 36 for each interconnect contact 22 hasan elevated topography relative to the planar first side 26 of thesubstrate 18 and a generally rectangular shaped outline. In addition,the compliant conductive layer 36 for each interconnect contact 22 has astepped shape and a hollow interior portion 38 open on opposedlongitudinal sides. Further, the compliant conductive layer 36 for eachinterconnect contact 22 includes a base portion 45 on the substrate 18,a tip portion 42 configured to electrically engage a component contact16 (FIG. 1E), and an opposed pair of shaped spring segment portions 44configured to allow z-direction movement, or flexure, of the tip portion42 during electrical engagement of the component contact 16.

The flexibility of the compliant conductive layer 36 allows theinterconnect contacts 22 to accommodate variations in the planarity ofthe component contacts 16. For example, some component contacts 16 maybe contained in an offset plane relative to the other component contacts16 on a component 14. In this case, the compliant conductive layers 36on the interconnect contacts 22 can move independently of one another,such that reliable electrical connections can be made, even with thevariations in the planarity of one or more of the component contacts 16.

Further, the compliant conductive layer 36 is configured to maintain itsshape with continued usage, and to exert a contact force F (FIG. 1F)during electrical engagement of the component contacts 16. The compliantconductive layer 36 can comprise a highly conductive metal such as Ti,Cu, Al, W, Mo, Ta, Be, Mg and alloys of these metals, such as BeCu. Thecompliant conductive layer 36 can also comprise a conductive polymer,such as a silver filled silicone, provided the polymer is formulated toreturn to its original shape following deformation.

As shown in FIG. 1E, the tip portions 42 of the interconnect contacts 22are configured to physically and electrically engage the componentcontacts 16, as the interconnect 10 is pressed against the wafer 12 by atest apparatus. In addition, as shown in FIG. 1F, the tip portions 42are configured to move in the z-direction as the interconnect 10 isoverdriven into the wafer 12 by the test apparatus. As also shown inFIG. 1F, the spring segment portions 44 are configured to flex duringmovement of the tip portions 42.

The interconnect contacts 22 are configured to electrically engage smallclosely spaced component contacts 16, such as inner lead bonds (ILB),having a spacing of about 100 μm or smaller. In addition, theinterconnect contacts 22 are configured to electrically engage eitherplanar component contacts or bumped component contacts. For example, inFIG. 1F, the interconnect contact 22 is shown electrically engaging aplanar component contact 16. In FIG. 1G, the interconnect contact 22 isshown electrically engaging a bumped component contact 22B, such as aterminal contact, or an outer lead bond (OLB) on the component 14.

In addition, the tip portions 42 of the compliant conductive layers 36can be sized to penetrate the component contacts 16 but withoutsubstantially distorting the component contacts 16. By way of example, awidth of the tip portions 42 can be from 10 μm to 50 μm. In addition,although the tip portions 42 are shown as having planar surfaces, thetip portions 42 can also have pointed or conical surfaces.

As shown in FIG. 1H, an alternate embodiment interconnect contact 22P issubstantially similar in construction to the interconnect contact 22(FIG. 1C), but includes a compliant conductive layer 36P having one ormore penetrating structures 48P, such as points or blades, configured topenetrate the component contacts 16 to a limited penetration depth.

As shown in FIG. 1I, an alternate embodiment interconnect contact 22PPis substantially similar in construction to the interconnect contact 22(FIG. 1C), but includes a compliant conductive layer 36PP havingpenetrating particles 50PP such as diamond, synthetic diamond, cubicboron nitride, or carbon particles, configured to penetrate thecomponent contacts 16. U.S. Pat. No. 6,285,204B1 to Farnworth, entitled“Method For Testing Semiconductor Packages Using Oxide Penetrating TestContacts”, which is incorporated herein by reference, describes contactsformed with penetrating particles.

Referring to FIGS. 2A-2C, an alternate embodiment interconnect contact22A is illustrated. The interconnect contact 22A is substantiallysimilar in construction to the interconnect contact 22 (FIG. 1C), but iscircular when viewed from above, rather than rectangular. In addition,the interconnect contact 22A is generally dome shaped, and has anenclosed interior portion 38A.

The interconnect contact 22A includes a compliant conductive layer 36Ahaving a tip portion 42A configured to physically and electricallyengage the component contact 16 on the component 14. In this embodimentthere are no separate spring segment portions 44 (FIG. 1C) as the domeshape of the compliant conductive layer 36A provides the spring forcefor the tip portion 42A. In addition, the compliant conductive layer 36Aincludes an opening 40A, which as will be further explained, providesaccess for forming the enclosed interior portion 38A.

The interconnect contact 22A is formed on a substrate 18A, and includesconductors 46A on a first side 26A of the substrate 18A in electricalcommunication with the compliant conductive layer 36A. The conductors46A can also be in electrical communication with edge contacts (notshown) on the first side 26A of the substrate 18A, which serve the samefunction as the terminal contacts 28 (FIG. 1C).

As shown in FIG. 2C, the compliant conductive layer 36A deforms under abiasing force applied by a test apparatus, such that the tip portion 42Aexerts a contact force on the component contact 16. In addition, the tipportion 42A can move in the z-direction, to accommodate variations inthe planarity of the component contacts 16, substantially as previouslydescribed.

Referring to FIGS. 3A-3C, an alternate embodiment interconnect contact22B is illustrated. The interconnect contact 22B is substantiallysimilar in construction to the interconnect contact 22 (FIG. 1C), but issquare when viewed from above, rather than rectangular. In addition, theinterconnect contact 22B has an enclosed interior portion 38B and fourspring segment portions 44B located along the four sides of the squareshape. The interconnect contact 22B includes a compliant conductivelayer 36B having a tip portion 42B configured to physically andelectrically engage the component contact 16 on the component 14. Thecompliant conductive layer 36B also includes an opening 40B, which aswill be further explained, provides access for forming the enclosedinterior portion 38B.

The interconnect contact 22B is formed on a substrate 18B and includesconductors 46B on a first side 26B of the substrate 18B in electricalcommunication with the compliant conductive layer 36B. The conductors46B can also be in electrical communication with edge contacts (notshown) on the substrate 18B, which serve the same function as theterminal contacts 28 (FIG. 1E).

As shown in FIG. 3C, the compliant conductive layer 36B deforms under abiasing force applied by a test apparatus, such that the tip portion 42Bexerts a contact force on the component contact 16. In addition, the tipportion 42B can move in the z-direction to accommodate variations in theplanarity of the component contacts 16, substantially as previouslydescribed.

Referring to FIG. 4, an alternate embodiment interconnect contact 22C issubstantially similar to the interconnect contact 22 (FIG. 1C)previously described. However, the interconnect contact 22C includes apolymer tape 52C, which comprises a polymer substrate 54C and acompliant conductive layer 36C on the polymer substrate 54C. The polymertape 52C is similar to a multilayered TAB tape, such as “ASMAT”manufactured by Nitto Denko of Japan. The interconnect contact 22C alsoincludes a hollow interior portion 38C substantially as previouslydescribed.

Referring to FIGS. 5A-5D, an alternate embodiment interconnect contact22D is illustrated. The interconnect contact 22D includes a compliantconductive layer 36D having a tip portion 42D configured to physicallyand electrically engage the component contact 16 on the component 14.The compliant conductive layer 36B also includes spring segment portions44D formed in an opening 56D in a substrate 18D. The compliantconductive layer 36B also includes conductive base portions 60D whichline the opening 56D in the substrate 18D.

The interconnect contact 22D also includes conductors 46D on a secondside 30D of the substrate 18D in electrical communication with thecompliant conductive layer 36D. The interconnect contact 22D alsoincludes a terminal contact 28D on the second side 30D in electricalcommunication with the conductors 46D. In addition, the interconnectcontact 22D includes electrically insulating layers 32D, whichelectrically insulate the base portions 60D of the compliant conductivelayer 36D and the conductors 46D from the substrate 18D. However, if thesubstrate 18D comprises an electrically insulating material, such asplastic or ceramic, the insulating layers 32D are not required.

As shown in FIG. 5C, the compliant conductive layer 36D is shaped as aspring configured to deform under a biasing force applied by a testapparatus, such that the tip portion 42D exerts a contact force on thecomponent contact 16. In addition, the tip portion 42D can move in thez-direction to accommodate variations in the planarity of the componentcontacts 16, substantially as previously described. Further, the springsegment portions 44D and the tip portion 42D can move into the opening56D, if required, to provide additional z-direction movement.

As shown in FIG. 5D, the interconnect contact 22D can also include apolymer stop plane element 58D configured to limit the movement of thespring segment portions 44D and the tip portion 42D. The polymer stopplane element 58D can comprise a donut shaped member formed on a firstside 26D of the substrate 18D circumjacent to the compliant conductivelayer 36D. In addition, the polymer stop plane element 58D has athickness selected to allow the tip portion 42D to flex by only aselected amount following engagement with the component contact 16.

Referring to FIG. 6, an alternate embodiment interconnect contact 22E issubstantially similar to the interconnect contact 22D. The interconnectcontact 22E includes a compliant conductive layer 36E formed over anopening 56E in a substrate 18E, substantially as previously describedfor interconnect contact 22D. In addition, the compliant conductivelayer 36E is formed as a closed spring segment with a generally pointedtip portion 42E.

Referring to FIGS. 7A-7H, steps in a method for fabricating theinterconnect contact 22 (FIGS. 1A-1F) are illustrated. Essentially thesame method can also be used to fabricate the interconnect contact 22P(FIG. 1H), the interconnect contact 22PP (FIG. 1I), the interconnectcontact 22A (FIGS. 2A-2C), the interconnect contact 22B (FIGS. 3A-3C),or the interconnect contact 22C (FIG. 4).

Initially, as shown in FIG. 7A, the substrate 18 can be provided. Thesubstrate 18 can be contained on a wafer or panel of material containinga plurality of substrates 18, such that a wafer level fabrication methodcan be used. In the illustrative embodiment the substrate 18 comprises asemiconductor material, such as silicon, germanium or gallium arsenide.Alternately, the substrate 18 can comprise another machineable oretchable material, such as ceramic or plastic.

As also shown in FIG. 7A, a first etch mask 70 can be formed on thesubstrate 18. For simplicity, the first etch mask 70 is illustrated asforming a single interconnect contact 22. However, in actual practicethe first etch mask 70 can be configured to form multiple interconnectcontacts 22 for multiple interconnects 10. The first etch mask 70 cancomprise a photoimageable material, such as a negative or positive toneresist, or a hard mask, such as Si₃N₄, patterned using a resist. Thefirst etch mask 70 has a peripheral outline which corresponds to theperipheral outline of the spring segment portions 44 of the interconnectcontact 22.

As shown in FIG. 7B, the first etch mask 70 can be used to etch thesubstrate 18 to form a stepped base 72, and then removed using asuitable stripper. Etching can be performed using a suitable wet etchantfor the substrate material, such as KOH, or tetramethylammoniumhydroxide(TMAH), for a silicon substrate. In addition, the etch process can becontrolled to form the stepped base 72 with a required height on thesubstrate 18. In addition to forming the stepped base 72, the etchprocess also thins the substrate 18 by an amount equal to the height ofthe stepped base 72.

Next, as shown in FIG. 7C, a second etch mask 76 is formed on thestepped base 72, substantially as previously described for first etchmask 70.

Next, as shown in FIG. 7D, the second etch mask 76 can be used to etch astepped tip 74 on the stepped base 72, and thin the substrate 18,substantially as previously described for the stepped base 72. Followingthis etch step the second etch mask 76 can be removed using a suitablestripper.

Next, as shown in FIG. 7E, the electrically insulating layer 32 can beformed on the surfaces of the stepped base 72 and the stepped tip 74,and on the first side 26 of the substrate 18. The electricallyinsulating layer 32 can comprise a deposited polymer, such as polyimideor parylene, or a grown oxide, such as SiO₂.

Next, as shown in FIG. 7F, the compliant conductive layer 36 can beformed on the insulating layer 32 such that it covers the stepped tip74, the stepped base 72, and a portion of the first side 26 of thesubstrate 18. The compliant conductive layer 36 includes the baseportion 45 on the first side 26 of the substrate 18. In addition, thecompliant conductive layer 36 can be open on one or more sides, suchthat access is provided for etching away the stepped tip 74 and thestepped base 72, to form the hollow interior portion 38 (FIG. 7G).

Alternately, the compliant conductive layer 36 can completely enclosethe stepped tip 74 and the stepped base 72, and openings 40A (FIG. 2A)or 40B (FIG. 3A) can be formed in the compliant conductive layer 36 forremoving the stepped tip 74 and the stepped base 72. In this case anadditional etch or laser machining process can be used to form theopenings 40A (FIG. 2A) or 40B (FIG. 3A) in the compliant conductivelayers 36A (FIG. 2A) or 36B (FIG. 3A).

The compliant conductive layer 36 can be formed by conformallydepositing a metal layer on the stepped tip 74, on the stepped base 72,and on portions of the first side 26 of the substrate 18. A suitabledeposition process, such as sputtering, CVD, electrolytic deposition, orelectroless deposition can be used to deposit the compliant conductivelayer 36 with a required thickness and peripheral outline. Suitablemetals for the compliant conductive layer 36 include Ti, Cu, Al, W, Mo,Ta, Be, Mg and alloys of these metals.

Alternately, the compliant conductive layer 36PP (FIG. 1I) can comprisea conductive polymer material, such as silver filled silicone,containing penetrating particles 50PP (FIG. 1I), such as dendritic metalor carbon particles. In addition, the conductive polymer can bedeposited using a suitable process such as stenciling or screenprinting.

As another alternative, the compliant conductive layer 36C (FIG. 4) cancomprise a polymer tape 52C (FIG. 4), which is adhesively bonded, orotherwise attached to the stepped tip 74, to the stepped base 72, and toportions of the first side 26 of the substrate 18.

Next, as shown in FIG. 7G, the substrate 18 can be etched, substantiallyas previously described, to form the hollow interior portion 38. Theetch step can also remove portions of the insulating layer 32 on thestepped tip 74 and the stepped base 72. Access for the wet etchant canbe through the sides of the compliant conductive layer 36, oralternately through the openings 40A (FIG. 2A) or 40B (FIG. 3A) in thecompliant conductive layers 36A (FIG. 2A) or 36B (FIG. 3A). In addition,end pointing of the etch step can be accomplished using techniques thatare known in the art.

Following the etch step, and as shown in FIG. 7H, conductors 46 can beformed on the first side 26 of the substrate 18 in electricalcommunication with the compliant conductive layers 36. The conductors 46can be formed using a subtractive process (e.g., etching a blanketdeposited metal layer through a mask), or an additive process (e.g.,depositing a metal through openings in a mask. In addition, theconductive vias 24 can be formed in the substrate 18 in electricalcommunication with the conductors 46. Alternately, the conductive vias24 can be formed in direct electrical communication with the compliantconductive layer 36.

The conductive vias 24 can be formed by etching, or laser machiningopenings in the substrate 18, forming the electrically insulating layers32 in the openings, and then forming a conductive material, such as ametal or a conductive polymer in the openings. One suitable process forforming the conductive vias 24 is described in U.S. Pat. No. 6,400,172B1 to Akram et al., entitled “Semiconductor Components Having LaseredMachined Conductive Vias”, which is incorporated herein by reference.

As also shown in FIG. 7H, the terminal contacts 28 can be formed on thesecond side 30 of the substrate 18 in electrical communication with theconductive vias 24. As with the conductors 46, the terminal contacts 28can be formed using a subtractive or an additive process Alternately,rather than conductive vias 24 and terminal contacts 28 on the secondside 30, the conductors 46 can be in electrical communication withterminal contacts (not shown) formed on the first side 26 of thesubstrate 18.

The interconnect contact 22P of FIG. 1H can be formed using essentiallythe same method outlined in FIGS. 7A-7H but with an additional etch ordeposition step to form the compliant conductive layer 36 withpenetrating structure 48P (FIG. 1H).

The interconnect contact 22A of FIGS. 2A-2C can be formed usingessentially the same method outlined in FIGS. 7A-7H. However, ratherthan etching the stepped base 72 and the stepped tip 74 in the substrate18, a bump with a radiused topography can be formed in the substrate 18using a suitable process, such as isotropic etching. One suitableetchant for isotropically etching silicon comprises a solution of HF,HNO₃ and H₂O. Access for removing the bump can then be provided byopening 40A in the compliant conductive layer 36A. The interconnectcontact 22B of FIGS. 3A-3C can be formed using essentially the samemethod outlined in FIGS. 7A-7H but by etching through openings 40B (FIG.3A) in the compliant conductive layer 36B.

Referring to FIGS. 8A-8G, steps in a method for fabricating theinterconnect contact 22D are illustrated. Initially, as shown in FIG.8A, the substrate 18D can be provided. The substrate 18D includes thesecond side 18D (backside), and the method includes fabrication stepsperformed from the second side 18D. As with the previous fabricationmethod, the substrate 18D can be contained on a wafer or panel ofmaterial containing a plurality of substrates 18D, such that a waferlevel fabrication method can be used. In the illustrative embodiment thesubstrate 18D comprises a semiconductor material, such as silicon,germanium or gallium arsenide. Alternately, the substrate 18D cancomprise another machineable or etchable material, such as ceramic orplastic.

Next, as shown in FIG. 8B, the opening 56D can be formed in thesubstrate 18D using a subtractive process, such as laser machining oretching. For laser machining, a laser machining apparatus 62 can be usedto direct a laser beam 64 at the second side 30D to vaporize selectedportions of the substrate 56D and form the opening 56D with a selectedsize and shape. The opening 56D initially includes a cylindrical portion66D, a counterbored portion 71D, a conical portion 68D and a tip opening69D. These elements are sized and shaped to correspond to the desiredsize and shape of the base portion 60D, the spring segment portions 44D,and the tip portion 42D of the compliant conductive layer 36D. Followingthe etch step to follow only the cylindrical portion 66D of the openingwill remain.

A suitable laser system for performing the laser machining step ismanufactured by Electro Scientific, Inc., of Portland, Oreg. and isdesignated a Model No. 2700. Another laser system is manufactured byXSIL Corporation of Dublin, Ireland and is designated a Model No.“XCISE-200”. A representative laser fluence for forming the opening 56Don a silicon substrate having a thickness of about 28 mils (725 μm), isfrom 2 to 10 watts/per opening at a pulse duration of 20-25 ns, and at arepetition rate of up to several thousand per second. The wavelength ofthe laser beam can be a standard UV wavelength (e.g., 355 nm).

If desired, following laser machining, an etching step can be performedto remove amorphous polysilicon and crystalline damaged silicon createdin a heat affected zone (HAZ) due to heating by the laser beam. Onesuitable wet etchant is tetramethylammoniumhydroxide (TMAH).

Rather than laser machining, etching techniques can be used to form theopening 56D with the cylindrical portion 66D, the counterbored portion71D, the conical portion 68D and the tip opening 69D. In this case, oneor more etch masks and a wet etchant, such as KOH or TMAH, substantiallyas described in the previous fabrication method, can be used to etchselected portions of the substrate 18D to form the substrate 18D.

Next, as shown in FIG. 8C, electrically insulating layers 66D are formedon the cylindrical portion 66D of the opening 56D and on the second side30D of the substrate 18D. The insulating layers 66D can be a grown or adeposited material. For example the insulating layers 66D can comprise aparylene polymer deposited from the vapor phase by a process similar tovacuum metallization at pressures of about 0.1 torr. Suitable polymersinclude parylene C, parylene N, and parylene D. Parylene is availablefrom Advanced Coating of Tempe, Ariz. One suitable deposition apparatusfor depositing parylene polymers is a portable parylene depositionsystem, designated a model PDS 2010 LABCOATER 2, manufactured bySpecialty Coating Systems, of Indianapolis, Ind. A thickness range forthe insulating layer 66D can be from 0.10 to 76 μm or greater.

Rather than parylene polymers, the insulating layers 66D can be anoxide, such as SiO₂, formed by a growth process by exposure of the basewafer 54 to an O₂ atmosphere at an elevated temperature (e.g., 950° C.).Alternately, the insulating layers 66D can comprise an electricallyinsulating material, such as an oxide or a nitride, deposited using adeposition process such as CVD, or a polymer material deposited using asuitable deposition process such as screen printing.

Next, as shown in FIG. 8D, the compliant conductive layer 36D can beformed by forming a conductive material on the cylindrical portion 66D,the counterbored portion 71D, the conical portion 68D and in the tipopening 69D of the opening 56D. The conductive material can comprise ahighly conductive metal, such as Ti, Cu, Al, W, Mo, Ta, Be, Mg andalloys of these metals. The above metals can be deposited on thesidewalls of the opening 56D using a deposition process, such aselectroless deposition, CVD, or electrolytic deposition. In addition,the conductive material can comprise a single metal or different layersof metal, such as a bonding layer and a non-oxidizing layer.

Rather than being a metal, the conductive material can comprise aconductive polymer, such as a metal filled silicone, or an isotropicepoxy. A suitable deposition process, such as screen printing, orstenciling, can be used to deposit the conductive polymer into theopening 56D. Suitable conductive polymers are available from A.I.Technology, Trenton, N.J.; Sheldahl, Northfield, Minn.; and 3M, St.Paul, Minn. Another suitable conductive polymer is a nano-particle pasteor ink, having metal nano-particles made of a highly conductive metal,such as aluminum. Nano-particle conductive polymers are commerciallyavailable from Superior Micropowders, of Albuquerque, N. Mex.

Next, as shown in FIG. 8E, a thinning step is performed to thin thesubstrate 18D and expose the compliant conductive layer 36D. Thethinning step also exposes the first side 26D of the substrate 18D, andremoves the counterbored portion 71D, the conical portion 68D and thetip opening 69D of the opening 56D. One method for thinning thesubstrate 18D is with an etching process using etch masks (if required)and a suitable wet etchant, substantially as previously described. Thethinning step can be end pointed on the compliant conductive layer 36D.

Besides wet etching, other suitable processes that can be employed tothin the substrate 18D include downstream plasma etching, micro waveplasma etching and SFG dry etching.

As shown in FIG. 8F, the compliant conductive layer 36D is configured todeflect into the opening 56D in the substrate 18D upon application of aforce F to the tip portion 42D, substantially as previously described.

An optional additional step for forming the polymer stop plane element58D is shown in FIG. 8G. In this case, a polymer layer can be depositedon the first side 26D of the substrate 18D, and an opening 82D formedcircumjacent to the compliant conductive layer 36D. The polymer stopplane element 58D can comprise a donut shape element with the opening82D therein, or a blanket deposited material with the opening 82Dtherein. In addition, the polymer stop plane element 58D can have athickness selected such that it functions as a stop plane for limitingmovement of the tip portion 42D substantially as previously described.

One method for forming the polymer stop plane element 58D is with astereo lithographic process. With stereo lithography, the polymer stopplane element 58D can comprise a laser imageable material, such as a“Cibatool SL 5530” resin manufactured by Ciba Specialty ChemicalsCorporation, or an “SI40” laser imageable material manufactured by RPCCorporation. To perform the stereo lithographic process, a layer of thelaser imageable material can be blanket deposited on the substrate 18 inviscous form using a suitable process such as spin on, and then exposedusing a laser beam to define the opening 82D. The layer can then bedeveloped to form the opening 82D in the exposed area. The layer canthen be rinsed, cleaned with a cleaning agent such as alcohol, spun toremove excess material, and then cured.

A stereo lithography system for performing the imaging process isavailable from 3D Systems, Inc. of Valencia, Calif. In addition,stereographic lithographic processes (3-D) are described in U.S.application Ser. No. 09/259,142, to Farnworth et al. filed on Feb. 26,1999, in U.S. application Ser. No. 09/652,340, U.S. Pat. No. 6,544,902to Farnworth et al. filed on Aug. 31, 2000, and in U.S. provisionalapplication Ser. No. 60/425,567, to Farnworth et al. filed on Nov. 11,2002, all of which are incorporated herein by reference.

As another alternative for forming the polymer stop plane element 58D, aconventional photo tool can be configured to expose a photoimageablematerial, such as a resist, using electromagnetic radiation in the G, Hor I broadband.

The interconnect contact 22E of FIG. 6, can be made using essentiallythe same process as outlined in FIGS. 8A-8G. However, the tip portion42E can be made by depositing the conductive material only on thesidewalls of the tip opening 69D (FIG. 8C) of the opening 56D.

Referring to FIG. 9, a wafer level testing system 92W incorporating thewafer level interconnect 10, and configured to test the semiconductorwafer 18 is illustrated. In the illustrative embodiment, theinterconnect 10 includes the interconnect contacts 22, which aspreviously described, are configured to make temporary electricalconnections with the component contacts 16 on the wafer 18 for applyingtest signals to the components 14. Alternately, the interconnect 10 caninclude any of the previously described interconnect contacts 22P, 22PP,22A, 22B, 22C, 22D, or 22E.

The testing system 92W includes a testing apparatus 84, and the testcircuitry 34 in electrical communication with the wafer levelinterconnect 10. The testing apparatus 84 can comprise a conventionalwafer probe handler, or probe tester, modified for use with theinterconnect 10. Wafer probe handlers and associated test equipment arecommercially available from Electroglass, Advantest, Teradyne, Megatest,Hewlett-Packard and others. In this system 92W, the interconnect 10takes the place of a conventional probe card, and can be mounted on thetesting apparatus 62 using techniques that are known in the art.

For example, the interconnect 10 can mount to a probe card fixture 88 ofthe testing apparatus 84. The probe card fixture 88 can be similar inconstruction to a conventional probe card fixture commercially availablefrom manufacturers such as Packard Hughes Interconnect and WentworthLaboratories. In addition, the testing apparatus 84 can include springloaded electrical connectors 90 associated with the probe card fixture88.

The spring loaded electrical connectors 90 are in electricalcommunication with the test circuitry 34. The test circuitry 34 isadapted to apply test signals to the integrated circuits on thecomponents 14 and to analyze the resultant signals. Test circuitry 34 iscommercially available from the above manufacturers as well as others.

The spring loaded electrical connectors 90 can be formed in a variety ofconfigurations. One suitable configuration is known as a “POGO PIN”connector. This type of electrical connector includes a spring loadedpin adapted to contact and press against a flat surface to form anelectrical connection. Pogo pin connectors are manufactured by PogoInstruments, Inc., Kansas City, Kans. The spring loaded electricalconnectors 90 can also comprise wires, pins or cables formed as springsegments or other resilient members.

The spring loaded electrical connectors 90 are configured toelectrically contact the terminal contacts 28 on the interconnect 10.This arrangement provides separate electrical paths from the testcircuitry 34, through the spring loaded electrical connectors 90,through the terminal contacts 28, through the conductive vias 24,through the conductors 46, and through the interconnect contacts 22 tothe component contacts 16. During a test procedure, test signals can beapplied to the integrated circuits on the components 14 using theseseparate electrical paths. Other mounting arrangements for theinterconnect 10 are described in U.S. Pat. No. 6,275,052 B1 to Hembreeet al., which is incorporated herein by reference.

The testing apparatus 84 also includes a wafer chuck 86 configured tosupport and move the wafer 18 in X, Y and Z directions as required, suchthat the interconnect contacts 22 align with, and make physical andelectrical contact with all of the component contacts 16 on the wafer 18at the same time. Test signals can then be selectively applied andelectronically switched as required, to selected components 14 andcomponent contacts 16. Alternately, the wafer chuck 86 can be used tostep the wafer 18, so that the components 14 can be tested in selectedgroups, or one at a time.

Referring to FIGS. 10A and 10B, a die level interconnect 10D isillustrated. The interconnect 10D is configured to test singulatedsemiconductor components 14D (FIG. 10B), such as a semiconductor dice orpackages, having bumped component contacts 16B in an area array (e.g.,ball grid array). In the illustrative embodiment, the interconnect 10Dincludes a plurality of interconnect contacts 22D arranged in an areaarray, which matches the area array of the bumped component contacts16B. Alternately, the interconnect 10D can include any of the previouslydescribed interconnect contacts 22, 22P, 22PP, 22A, 22B, 22C or 22E.Further, the singulated component 14D can include planar componentcontacts 16, rather than bumped component contacts 16B.

Referring to FIGS. 11A-11C, a die level test system 92D incorporatingthe die level interconnect 10D is illustrated. The test system 92Dincludes a test carrier 94 configured to temporarily package thesemiconductor components 14D for test and burn-in. The semiconductorcomponents 14D include the bumped component contacts 16B in electricalcommunication with the integrated circuits contained on the components14D.

The test carrier 94 includes four of the die level interconnects 10D,each of which is configured to electrically engage a component 14D.Specifically, the interconnects 10D include interconnect contacts 22D,as previously described, configured to make temporary electricalconnections with the bumped component contacts 16B on the components14D. The interconnects 10D also include bumped terminal contacts 28Dconfigured to electrically engage mating electrical connectors (notshown) on a test apparatus 96 (FIG. 11A), such as a burn-in board.

The test apparatus 96 includes, or is in electrical communication withdie level test circuitry 34D (FIG. 11A), configured to apply testsignals to the integrated circuits contained on the components 14D, andto analyze the resultant signals. The test circuitry 34D transmits thetest signals through the terminal contacts 28D and the interconnectcontacts 22D on the interconnects 10D to the bumped component contacts16B on the components 14D.

The test carrier 94 also includes a force applying mechanism 98configured to bias the components 14D against the interconnects 10D, andan alignment member 100 configured to align the bumped componentcontacts 16B on the components 14D, to the interconnect contacts 22D onthe interconnects 10D. The alignment member 100 includes openings 102configured to contact the peripheral edges of the components 14D toguide the components 14D onto the interconnect contacts 22D. Thealignment member 100 can be constructed, as described in U.S. Pat. No.5,559,444, to Farnworth et al. which is incorporated herein byreference. Alternately, the alignment member 100 can be eliminated andoptical alignment techniques can be employed to align the components14D.

As shown in FIGS. 11A and 11B, the force applying mechanism 98 comprisesa clamp member which attaches to the interconnects 10D, and a pluralityof biasing members 104 for pressing the components 14D against thecontacts 22D. In the illustrative embodiment, the biasing members 104comprise elastomeric blocks formed of a polymer material such assilicone, butyl rubber, flourosilicone, or polyimide. Alternately thebiasing members 104 can comprise steel leaf springs. The force applyingmechanism 92D includes tabs 106 for engaging the interconnects 10D tosecure the force applying mechanism 92D to the interconnects 10D. In theillustrative embodiment, the force applying mechanism 92D attachesdirectly to the interconnects 10D, which are configured to form a basefor the test carrier 94. However, the test carrier 94 can include aseparate base, and one or more interconnects 10D can be mounted to thebase as described in U.S. Pat. No. 5,519,332 to Wood et al.; U.S. Pat.No. 5,541,525 to Wood et al.; U.S. Pat. No. 5,815,000 to Farnworth etal.; and U.S. Pat. No. 5,783,461 to Hembree, all of which areincorporated herein by reference.

Thus the invention provides an improved interconnect for semiconductorcomponents, methods for fabricating the interconnect and test systemsincorporating the interconnect. While the invention has been describedwith reference to certain preferred embodiments, as will be apparent tothose skilled in the art, certain changes and modifications can be madewithout departing from the scope of the invention as defined by thefollowing claims.

1. A system for testing a semiconductor wafer containing a plurality ofsemiconductor components having a plurality of component contactscomprising: a test circuitry configured to apply test signals to thecomponents; a testing apparatus configured to support and move thewafer; an interconnect on the testing apparatus comprising a substratehaving a planar side and a plurality of interconnect contacts on thesubstrate in electrical communication with the test circuitry andconfigured to electrically engage the component contacts, eachinterconnect contact comprising a continuous compliant conductive layeron the substrate comprising a stepped base on the planar side, a tipportion elevated with respect to the planar side for contacting acomponent contact, an opposed pair of shaped spring segment portionsattached to the base supporting the tip portion, and a hollow interiorportion at least partially enclosed by the planar side, the springsegment portions and the tip portion, the tip portion configured toelectrically engage the component contact with a force exerted by thespring segment portions.
 2. The system of claim 1 wherein the testingapparatus comprises a wafer probe handler.
 3. The system of claim 1further comprising a plurality of spring loaded electrical connectors onthe testing apparatus configured to electrically engage terminalcontacts on the substrate in electrical communication with theinterconnect contacts.
 4. The system of claim 1 wherein the interconnectcontacts comprise penetrating structures configured to penetrate thecomponent contacts.
 5. The system of claim 1 wherein the compliantconductive layer comprises a metal or a conductive polymer.
 6. A systemfor testing a semiconductor wafer containing a plurality ofsemiconductor components having a plurality of component contactscomprising: a test circuitry configured to apply test signals to thecomponents; a wafer probe handler configured to support and move thewafer; and an interconnect on the wafer probe handler comprising asubstrate having a planar side, and a plurality of interconnect contactson the substrate configured to electrically engage the componentcontacts, each interconnect contact comprising a continuous compliantconductive layer having a base portion on the planar side, opposingspring segment portions on the base portion, and a tip portion on thespring segment portions configured to electrically engage the componentcontact with a force exerted by the spring segment portions.
 7. Thesystem of claim 6 wherein the wafer probe handler includes a probe cardfixture and the interconnect mounts to the probe card fixture.
 8. Asystem for testing a semiconductor wafer containing a plurality ofsemiconductor components having a plurality of component contactscomprising: a test circuitry configured to apply test signals to thecomponents; a wafer probe handler configured to support and move thewafer; and an interconnect on the wafer probe handler comprising asubstrate, and a plurality of interconnect contacts on the substrateconfigured to electrically engage the component contacts, eachinterconnect contact comprising a compliant conductive layer comprisinga continuous conductive material having a base portion lining an openingin the substrate from the first side to the second side, a shaped springsegment portion attached to base portion covering the opening, and a tipportion on the shaped spring segment portion, the spring segment portionconfigured to move into the opening and to press the tip portion intothe component contact with a contact force.
 9. The system of claim 8further comprising a stop plane element on the first side configured tolimit axial movement of the tip portion.
 10. The system of claim 8wherein the spring segment portion has a generally conical shape. 11.The system of claim 8 wherein the tip portion has an enclosed springshape.
 12. A system for testing a semiconductor component having acomponent contact comprising: a test circuitry configured to apply testsignals to the component; a test apparatus configured to handle thecomponent; an interconnect on the test apparatus comprising a substratehaving a first side and a second side, and a plurality of interconnectcontacts on the substrate in electrical communication with the testcircuitry configured to electrically engage the component contacts, eachinterconnect contact comprising an opening in the substrate from thefirst side to the second side, and a compliant conductive layercomprising a base portion lining the opening, a spring segment portionattached to base portion having an enclosed interior portion, and a tipportion on the spring segment portion configured to move in an axialdirection to contact the component contact, the spring segment portionconfigured to deform and move into the opening during the movement ofthe tip portion; and a conductor on the second side in electricalcommunication with the base portion.
 13. A system for testing asemiconductor component having a component contact comprising: a testcircuitry configured to apply test signals to the component; a testapparatus configured to handle the component; an interconnect on thetest apparatus comprising a substrate, and a plurality of interconnectcontacts on the substrate in electrical communication with the testcircuitry and configured to electrically engage the component contacts,each interconnect contact comprising an opening in the substrate, a baseportion lining the opening, a spring segment portion attached to baseportion having an enclosed interior portion, and a tip portion on thespring segment portion configured to move in an axial direction tocontact the component contact; and a polymer layer configured to limitmovement of the tip portion during contact with the component contact.14. The system of claim 13 wherein the polymer layer comprises a polymerdonut circumjacent to the opening.
 15. The system of claim 13 whereinthe component comprises a semiconductor wafer and the test apparatuscomprise a wafer probe handler.
 16. The system of claim 13 wherein thetest apparatus comprises a wafer probe handler with a probe card fixtureand the interconnect mounts to the probe card fixture.
 17. A system fortesting a semiconductor component having a component contact comprising:a test circuitry configured to apply test signals to the component; atest apparatus configured to handle the component; an interconnect onthe test apparatus comprising a substrate, and a plurality ofinterconnect contacts on the substrate in electrical communication withthe test circuitry and configured to electrically engage the componentcontacts, each interconnect contact comprising an opening in thesubstrate, a base portion lining the opening, a spring segment portionattached to base portion having an enclosed interior portion, and a tipportion on the spring segment portion configured to move in an axialdirection to contact the component contact; and a polymer donutcircumjacent to the opening configured to limit movement of the tipportion during contact with the component contact.